tree 658c7062cdaf1a4b35be7c7afaf4b87b293e6085
parent 52b8d439d543ae96669c2dc227e20589cf86895f
author Manish Pandey <manish.pandey2@arm.com> 1682328592 +0100
committer Manish Pandey <manish.pandey2@arm.com> 1682697800 +0200

feat: unify lower EL EA tests

Lower EL External Abort tests were implemented in such a way that after
triggering EA in tftf it gets trapped in EL3 and causing a crash in EL3
Because of the tests ending up in crash there are few problems:
 - Need to have to seperate tests one each for sync EA and Serror.
 - Unable to test the behaviour of system had the lower EL EA's been
   properly handled in EL3

This patch removes two separate configurations into a single test under
Firmware first handling(FFH). TF-A build macro PLATFORM_TEST_EA_FFH
allows fvp to have a proper handling.

This test configuration tests FFH(SCR_EL3.EA = 1) without RAS.

No need to create a new lower el panic test as they are tested in other
scenarios also.

Signed-off-by: Manish Pandey <manish.pandey2@arm.com>
Change-Id: If31ca9ad5f859e219d7cd2482397c52f84587a32