feat: unify lower EL EA tests
Lower EL External Abort tests were implemented in such a way that after
triggering EA in tftf it gets trapped in EL3 and causing a crash in EL3
Because of the tests ending up in crash there are few problems:
- Need to have to seperate tests one each for sync EA and Serror.
- Unable to test the behaviour of system had the lower EL EA's been
properly handled in EL3
This patch removes two separate configurations into a single test under
Firmware first handling(FFH). TF-A build macro PLATFORM_TEST_EA_FFH
allows fvp to have a proper handling.
This test configuration tests FFH(SCR_EL3.EA = 1) without RAS.
No need to create a new lower el panic test as they are tested in other
scenarios also.
Signed-off-by: Manish Pandey <manish.pandey2@arm.com>
Change-Id: If31ca9ad5f859e219d7cd2482397c52f84587a32
diff --git a/tf_config/fvp-ea-ffh b/tf_config/fvp-ea-ffh
new file mode 100644
index 0000000..e7a71d1
--- /dev/null
+++ b/tf_config/fvp-ea-ffh
@@ -0,0 +1,4 @@
+CROSS_COMPILE=aarch64-none-elf-
+HANDLE_EA_EL3_FIRST_NS=1
+PLATFORM_TEST_EA_FFH=1
+PLAT=fvp