test(fuzz): Capability for random inputs
Adding model for random inputs to SMC calls using a
constraint mechanism with a multi tiered sanity
metric.
Change-Id: Ia750fa57359baa424f1af273ba24483ae7330c38
Signed-off-by: Mark Dykes <mark.dykes@arm.com>
diff --git a/smc_fuzz/include/sdei_fuzz_helper.h b/smc_fuzz/include/sdei_fuzz_helper.h
index cf4ddd1..72c179d 100644
--- a/smc_fuzz/include/sdei_fuzz_helper.h
+++ b/smc_fuzz/include/sdei_fuzz_helper.h
@@ -5,6 +5,8 @@
*/
#include <fuzz_helper.h>
+#include "smcmalloc.h"
+
#include <power_management.h>
#include <sdei.h>
#include <test_helpers.h>
@@ -36,4 +38,4 @@
void tftf_test_sdei_noarg(int64_t (*sdei_func)(void), char *funcstr);
void tftf_test_sdei_singlearg(int64_t (*sdei_func)(uint64_t), char *funcstr);
-void run_sdei_fuzz(int funcid);
+void run_sdei_fuzz(int funcid, struct memmod *mmod);