| commit | 88618b70c1c47aca426a257f1621df2540692f80 | [log] [tgz] |
|---|---|---|
| author | Julian Hall <julian.hall@arm.com> | Tue Dec 13 14:00:38 2022 +0000 |
| committer | Julian Hall <julian.hall@arm.com> | Tue Mar 21 10:16:16 2023 +0100 |
| tree | a95885377085a036c7e136fe313dcee9a88dd1a1 | |
| parent | 806c679c09e53ac8484f71043b744085eeb27cf3 [diff] |
Add power failure during update tests Adds tests that simulate a power failure at different points during the update flow. The tests are intended to check that the device is never left in an un-bootable state during the update process when unexpected power-cycles occur. Note that metadata atomic write robustness is tested separately under the banked_fw_store tests. Signed-off-by: Julian Hall <julian.hall@arm.com> Change-Id: I3326ab787509d208a3ff51d8381819d39929edf2