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/*
* Copyright (c) 2021, Arm Limited and Contributors. All rights reserved.
* SPDX-License-Identifier: BSD-3-Clause
*/
#ifndef TS_TEST_RUNNER_TEST_RESULT
#define TS_TEST_RUNNER_TEST_RESULT
#include <stdint.h>
/**
* Test result summary structure
*/
struct __attribute__ ((__packed__)) ts_test_runner_result_summary
{
uint32_t num_tests;
uint32_t num_passed;
uint32_t num_failed;
};
/**
* Variable length parameter tag for a test result object.
* Multiple test results may be returned for a test run.
*/
enum
{
/* A test result record describes the result of a
* particular test.
*/
TS_TEST_RUNNER_TEST_RESULT_TAG = 1
};
/* Test run state values */
enum
{
TS_TEST_RUNNER_TEST_RESULT_RUN_STATE_NOT_RUN = 1,
TS_TEST_RUNNER_TEST_RESULT_RUN_STATE_PASSED = 2,
TS_TEST_RUNNER_TEST_RESULT_RUN_STATE_FAILED = 3
};
/* Test result fixed sized structure */
struct __attribute__ ((__packed__)) ts_test_runner_test_result
{
uint32_t run_state;
};
/* Variable length output parameter tags */
enum
{
/* The name of the test */
TS_TEST_RUNNER_TEST_RESULT_TAG_NAME = 1,
/* The group the test belongs to */
TS_TEST_RUNNER_TEST_RESULT_TAG_GROUP = 2,
/* Test failure recorded, optionally included on failure */
TS_TEST_RUNNER_TEST_RESULT_TAG_FAILURE = 3
};
/* Test failure fixed sized structure */
struct __attribute__ ((__packed__)) ts_test_runner_test_failure
{
uint32_t line_num;
uint64_t info;
};
#endif /* TS_TEST_RUNNER_TEST_RESULT */
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